Gijs Smit received his joint Bachelor's degree in Data Science from Eindhoven University of Technology and Tilburg University in 2019. Currently, he is pursuing a Master's degree in Data Science in Engineering at Eindhoven University of Technology. For the last three years, he also worked part-time as a Data Scientist at a consultancy firm named Pipple located in Eindhoven. From August 2020 to February 2021, he is doing his Master's internship at the Computational Pathology group. He works on the use of deep learning to detect artifacts in whole slide images under the supervision of Caner Mercan and Francesco Ciompi.